Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)

CONTACT US

Guarantor: Evelína Gablech, Ph.D.
Technology / Methodology: Probe microscopy & Nanomanipulation
Instrument status: Operational Operational, 2.4.2024 14:01
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano
Upcoming trainings: 5.6. 11:30 - 11:30: ICON-SPM basic training - Before you assign for this practical training, complete all mandatory prerequisites on CF Moodle educational platform: https://cfmoodle.ceitec.vutbr.cz/ Two courses are mandatory: 1) Course Scanning probe microscopy basics (in section General training- Microscopy) 2) Course ICON-SPM – Bruker – Dimension ICON (in section Equipment training – Nanocharacterization laboratory) Sign up to the CF Moodle with the same login as you use for the booking system. Enroll to the above-mentioned courses and follow the instructions within the courses. If you have difficulties with enrolling yourself to a course or any other troubles with Moodle, contact evelina.gablech@ceitec.vutbr.cz for help. It is not possible to take part in practical training without completed mandatory prerequisites prior to the training! Courses must be completed until 31.5.2024. User will not receive any reminder to complete the courses. Thus, it is the user's full responsibility to meet the stated prerequisites by the given deadline. Practical training is only for 3 persons. If the capacity of the training is already full, please do not sign up. Meeting point: Directly in the SPM laboratory.


Description:

Dimension Icon incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. It can be set up to perform major AFM modes such as Contact, Tapping, Noncontact, and additionally PeakForce in ScanAsyst imaging mode. In CEITEC Nano, we can perform advanced SPM modes such as Magnetic Force Microscopy, Piezoresponse Force Microscopy, Kelvin Probe Microscopy, Fast Tapping mode, and several other state-of-the-art techniques.


Publications:

  • KEPIČ, P.; LIŠKA, P.; IDESOVÁ, B.; CAHA, O.; LIGMAJER, F.; ŠIKOLA, T., 2024: Pulsed laser deposition of Sb2S3 films for phase-change tunable nanophotonics. NEW JOURNAL OF PHYSICS 26(1), p. 1 - 8, doi: 10.1088/1367-2630/ad1696; FULL TEXT
    (ICON-SPM, KRATOS-XPS, LYRA, ALD, WITEC-RAMAN, RIGAKU9, WOOLLAM-VIS)
  • Klíma, J., 2023: Spin waves in non-trivial magnetic landscapes. BACHELOR´S THESIS , p. 1 - 69; FULL TEXT
    (MIRA-EBL, LYRA, ICON-SPM, KERR-MICROSCOPE, BRILLOUIN, EVAPORATOR)
  • LIŠKA, P.; MUSÁLEK, T.; ŠAMOŘIL, T.; KRATOCHVÍL, M.; MATULA, R.; HORÁK, M.; NEDVĚD, M.; URBAN, J.; PLANER, J.; ROVENSKÁ, K.; DVOŘÁK, P.; KOLÍBAL, M.; KŘÁPEK, V.; KALOUSEK, R.; ŠIKOLA, T., 2023: Correlative Imaging of Individual CsPbBr3 Nanocrystals: Role of Isolated Grains in Photoluminescence of Perovskite Polycrystalline Thin Films. JOURNAL OF PHYSICAL CHEMISTRY C (PRINT) 127(25), p. 12404 - 10, doi: 10.1021/acs.jpcc.3c03056; FULL TEXT
    (LYRA, VERIOS, ICON-SPM, WITEC-RAMAN, KRATOS-XPS, TITAN)
  • PONGRÁCZ, J.; VACEK, P.; GRÖGER, R., 2023: Recombination activity of threading dislocations in MOVPE-grown AlN/Si {111} films etched by phosphoric acid. JOURNAL OF APPLIED PHYSICS 134(19), doi: 10.1063/5.0171937; FULL TEXT
    (LYRA, ICON-SPM, HELIOS, TITAN, LEICACOAT-NANO)
  • BRODSKÝ, J.; GABLECH, I.; MIGLIACCIO, L.; HAVLÍČEK, M.; DONAHUE, M.; GLOWACKI, E., 2023: Downsizing the Channel Length of Vertical Organic Electrochemical Transistors. ACS APPL MATER INTER 15(22), p. 27002 - 8, doi: 10.1021/acsami.3c02049; FULL TEXT
    (SUSS-MA8, EVAPORATOR, SCIA, PARYLENE, RIE-FLUORINE, MIRA-EBL, DEKTAK, ICON-SPM)

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